ETS 2011 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing.

In 2011 ETS will take place in Trondheim, Norway and is being organized by the Norwegian University of Science and Technology (NTNU) and sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society. Norway is known for its white summer nights; during the week of ETS'11 the sun will rise in Trondheim well before 4am and set close to 11pm.

You are invited to participate and submit your contributions to ETS’11. The areas of interest include
(but are not limited to) the following topics:

Analog Test
ATE Hardware and Software
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self Test (BIST)
Current-Based Test
Defect-Based Test
Delay and Performance Test
Dependability
Design for Test(ability) (DfT)
Design Verification and Validation
Diagnosis and Debug
Economics of Test
Failure Analysis
Fault Modelling and Simulation
Fault Tolerance
High-Speed I/O Test
Memory Test and Repair
MEMS Test

Microprocessor Test
Mixed-Signal Test
Nanotechnology Test
On-Line Test
Power Issues in Test
Reliability
RF Test
Self-Repair
Signal Integrity Test
Stacked IC Test
Standards in Test
System Test
System-in-Package (SiP) Test
System-on-Chip (SoC) Test
Test(ability) Synthesis
Test of Reconfigurable Systems
Test Quality
Thermal Issues in Test
Yield Analysis and Enhancement

Submissions

top

ETS’11 seeks original, unpublished contributions of the following types:

Scientific papers for the Formal proceedings, presenting novel and complete research work.
Workshop-type papers for the Informal Digest, including ‘emerging ideas’ and ‘case studies’.
Proposals for panels, embedded tutorials, and other special sessions.
‘Vendor Session’ presentations focusing on new features of test related products.
Student work-in-progress presenting on-going and not yet complete work.
Doctoral student contest is open for doctoral students in their final year.

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS’11 web page.

The ETS’11 organizing committee also encourages the organization of fringe meetings and workshops. Details can be found on the ETS`11 web page.

ETS’11 will produce Formal Proceedings of selected papers and an Informal Digest of Papers. The best contributions will be selected for submission to regular issues of the “Journal of Electronic Testing: Theory and Applications” (JETTA), published by Springer. A Best Paper Award of ETS’11 will be presented at ETS’12.

Key Dates

top

Submission deadline: December 6, 2010
Notification of acceptance:February 15, 2011
Final copy deadline: March 15, 2011

Additional Information

top

Einar J. Aas – General Chair
Department of Electronics and Telecommunications
Norwegian University of Science and Technology
NO-7491 Trondheim, Norway
Tel: +47 73 59 43 17, Fax: +47 73 59 14 41
E-Mail: einar.j.aas@iet.ntnu.no

Erik Larsson – Program Chair
Department of Computer Science
Linköping University
SE-581 83 Linköping, Sweden
Tel: +46 70 965 66 19, Fax: +46 13 28 44 99
E-Mail: erik.larsson@liu.se

Committees

top

Organizing Committee

General Chair/ Vice Chair
Einar J. Aas, Norwegian University of Science and Technology, NO
Lorena Anghel, IMAG, FR

Program Chair/Vice Chair
Erik Larsson, U. Linköping, SE
Matteo Sonza Reorda, Politecnico di Torino, IT

Industrial Relations Chair/Vice-Chair
Erik Jan Marinissen, IMEC, BE
Knut Båtstoløkken, Kitron AS, NO

Publications Chair
Cecilia Metra, IT

Publicity Chair
Øystein Gjermundnes, ARM Norway, NO

Embedded Tutorial Chair
Patrick Girard, FR

Panel Chair
Bernd Becker, DE

Fringe Workshops
Peter Harrod, UK

Student Activity Chair
Ilia Polian, DE

Topic Chairs

Lorena Anghel, FR
Krishnendu Chakrabarty, US
Said Hamdioui, NL
Sybille Hellebrand, DE
Hans Kerkhoff, NL
Salvador Mir, FR

Nicola Nicolici, CA
Jaan Raik, EE
Jochen Rivoir, DE
Bart Vermeulen, NL
Massimo Violante, IT
Mark Zwolinski, UK

Regional Liaisons
E. Cota, BR - South America
S. Kajihara, JP - Asia
A. Osseiran, AU - Australia
A. Singh, US - North America
A. Wahba, EG - Africa

Organizing Committee

Einar J. Aas, NO - Chair
Njård Hestnes, NO - Finance
Vemund Lindås, NO - Proceedings
Randi Kojen, NO - Local Arrangements, Registration
Bjørn B. Larsen, NO - Audio-visual, Web

Program Committee

M. Abadir, US	K. Hatayama, JP	A. Pataricza, HU
R. Aitken, US	M. Hirech, US	F. Poehl, DE
Z. Al-Ars, NL	M. Inoue, JP	J. Rajski, US
W. Anheier, DE	T. Inoue, JP	A. Richardson, UK
J. Arlat, FR	A. Ivanov, CA	B. Rouzeyre, FR
F. Azais, FR	G. Jervan, EE	A. Rubio, ES
M. Azimane, NL	R. Kapur, US	K. Saluja, US
P. Bernardi, IT	S. J. Knapskog, NO	P. Sanchez, ES
A. Bystrov, UK	Z. Kotasek, CZ	J. Schloeffel, DE
S. Di Carlo, IT	A. Krasniewski, PL	J. Segura, ES
G. Carlsson, SE	R. Krenz-Baath, DE	V. Singh, IN
L. Carro, BR	B. Kruseman, NL	M. B.Tahoori, DE
A. Chatterjee, US	S. Kundu, US	M. Tehranipoor, US
W.-T. Cheng, US	W. Kunz, DE	J. P. Teixeira, PT
A. Crouch, US	R. Leveugle, FR	N. Touba, US
J. Dabrowski, SE	M. Lubaszewski, BR	J. Tyszer, PL
R. Dorsch, DE	Y. Makris, US	R. Ubar, EE
G. Fey, DE	P. Maxwell, US	D. De Venuto, IT
M.-L. Flottes, FR	S. Mitra, US	H. T. Vierhaus, DE
F. Fummi, IT	G. Di Natale, FR	A. Virazel, FR
E. Gizdarski, USA	Z. Navabi, IR	X. Wen, JP
D. Gizopoulos, GR	F. Novak, SI	Q. Xu, HK
S. K. Goel, USA	A. Orailloglu, US
E. Gramatova, SK	S. Ozev, US

For more information, visit us on the web at: http://www.ieee-ets.org

The European Test Symposium (ETS 2011 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).